Acta Physica Polonica B

Vol. 34, No. 8, August 2003, page 4307

High Pressure X-Ray Diffraction Study of URu2Si2

K. Kuwahara, H. Sagayama, K. Iwasa, M. Kohgi, S. Miyazaki, J. Nozaki, J. Nogami, M. Yokoyama, H. Amitsuka, H. Nakao, Y. Murakami

We have performed high pressure X-ray diffraction measurements on a powder sample of the tetragonal heavy-electron compound URu2Si2 at low temperatures and pressure up to 3 GPa, in order to investigate a pressure-induced phase transition at Pc={\sim } 1.5 GPa, which was indicated in the neutron diffraction experiment under pressure. The pressure variations of the lattice parameters a and c at 15 K decrease monotonously with increasing pressure. No discontinuity of the lattice parameters of URu2Si2 around Pc is observed within experimental error.

PACS numbers: 71.27.+a, 75.30.Mb, 61.10.Eq, 62.50.+p


 
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