Acta Physica Polonica B

Vol. 34, No. 22, February 2003, page 1047


Magnetic Properties of Ce(Rh1-xRux)2Si2 Single Crystals for x up to 0.5

P. Haen, F. Lapierre, P. Lejay, T. Jaworska-Golab, C. Sekine, S. De Brion

Magnetoresistance measurements performed at 4.2 K up to B = 22 T applied along the tetragonal c-axis on antiferromagnetic single crystalline Ce(Rh1-xRux)2Si2 solid solutions (x = 0.05, 0.1 and 0.2) are reported. The 4.2 K resistivity, i.e. the residual resistivity, \rho 0, is strongly reduced in 22 T, showing that the large increase of \rho 0 with x can not be attributed to disorder alone. The results evidence two transitions at fields B{c}1 and B{c}2 which correspond to metamagnetic transitions, similar to the two step transition occuring in CeRh2Si2 at 25.8 and 26.3 T, respectively. B{c}1 and B{c}2 decrease rapidly with increasing x, and their splitting increases (showing some analogy with measurements reported for Ge doped CeRh2Si2). These variations and the rapid decrease of T{N}1 (which has vanished for x = 0.35), are discussed.

PACS numbers: 71.27.+a, 74.25.Fy, 74.25.Ha, 75.30.Kz


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